Semiconductor Wafer Inspection Transformed

Many laboratories rely on time consuming, labor intensive activities that must be performed by experts, often generating only basic/necessary data, or providing a yes/no answer. 

In this video, Mike Connell, VP Organizational Transformation, discusses how a time consuming quality inspection chore is transformed to reduce the time, while generating new data. The result is an innovative workflow that improves the manufacturing process.

Mike Connell | 1m43s | Semiconductor Wafer Inspection Automation Case Study


Enthought works with companies where science is critical to success, where digital technologies and skills provide the opportunity significant improvements in business performance. 

We collaborate with clients to develop scientific software and enabling infrastructure to make use of advanced visualization, modeling, simulation and AI/machine learning techniques. This collaboration is complemented by expert services and scientific computing training.

Enthought scientists have business-relevant domain expertise, enabling greater understanding of client challenges. We combine scientific software development and architecting skills to enable rapid development and prototyping, using all data to efficiently progress problem solving.


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